Optical constants are crucial properties of condensed matter that simplify the understanding of light interaction with materials. These values are essential for estimating various phenomena, including color, reflection, refraction, and scattering. They also play a significant role in analyzing multilayer properties and determining the thickness of thin films, making them vital for applications in optics and materials science.
Focusing on practical applications, this book provides an accessible introduction to the most commonly encountered optical phenomena. It aims to equip readers with essential knowledge and skills, making complex concepts easier to understand. Through clear explanations and real-world examples, it serves as a valuable resource for both students and professionals looking to deepen their understanding of optics in various contexts.
A one-stop, concise guide on determining and measuring thin film thickness by optical methods. This practical book covers the laws of electromagnetic radiation and interaction of light with matter, as well as the theory and practice of thickness measurement, and modern applications. In so doing, it shows the capabilities and opportunities of optical thickness determination and discusses the strengths and weaknesses of measurement devices along with their evaluation methods. Following an introduction to the topic, Chapter 2 presents the basics of the propagation of light and other electromagnetic radiation in space and matter. The main topic of this book, the determination of the thickness of a layer in a layer stack by measuring the spectral reflectance or transmittance, is treated in the following three chapters. The color of thin layers is discussed in chapter 6. Finally, in chapter 7, the author discusses several industrial applications of the layer thickness measurement, including high-reflection and anti-reflection coatings, photolithographic structuring of semiconductors, silicon on insulator, transparent conductive films, oxides and polymers, thin film photovoltaics, and heavily doped silicon. Aimed at industrial and academic researchers, engineers, developers and manufacturers involved in all areas of optical layer and thin optical film measurement and metrology, process control, real-time monitoring, and applications.
Filling the gap for a description of the optical properties of small particles with sizes less than 1000 nm and to provide a comprehensive overview on the spectral behavior of nanoparticulate matter, this is the most up-to-date reference on the optical physics of nanoparticle systems. The author, an expert in the field with both academic and industrial experience, concentrates on the linear optical properties, elastic light scattering and absorption of single nanoparticles and on reflectance and transmittance of nanoparticle matter.
Dünne Schichten aus transparenten oder halbtransparenten Materialien sind entscheidend für zahlreiche natürliche Phänomene und technische Anwendungen. Sie erzeugen durch Lichtinterferenz eine Vielzahl von Farben und finden sich in vielen alltäglichen Objekten, oft unbemerkt. Das Buch zielt darauf ab, umfassende Informationen über die Eigenschaften und Anwendungen solcher Schichten und Beschichtungen bereitzustellen, um deren Bedeutung in unserem Leben besser zu verstehen.
