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Springer Series in Surface Sciences - 65: Kelvin Probe Force MicroscopySascha SadewasserAgotadoNotifícame
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Computational Microelectronics: Strain-Induced Effects in Advanced MOSFETsViktor SverdlovAgotadoNotifícame
Statistische Verfahren zur Maschinen- und ProzessqualifikationAlfred Schulze-HinrichsAgotadoNotifícame
