Exploring scanning probe microscopy with MATHEMATICA

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This updated edition includes a CD-ROM and a new applications section, reflecting recent breakthroughs in the field. It offers a comprehensive set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. Serving as both a professional reference and an advanced text, it starts with foundational concepts and progresses to the latest techniques, experiments, and theories. The section on atomic force microscopy covers cantilever mechanical properties, tip-sample interactions, and cantilever vibration characteristics. It then delves into tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section addresses applications such as Kelvin and Raman probe microscopy. This self-contained presentation saves researchers time by providing the theoretical results needed to understand the models without extensive literature searches. The Mathematica code for all examples is included on the CD-ROM, allowing users to modify values and parameters or adjust the programs to meet specific modeling needs.