Bookbot

Semiconductor Interfaces: Formation and Properties

Proceedings of the Workkshop, Les Houches, France February 24–March 6, 1987

Más información sobre el libro

(ii) Fine characterization down to the atomic scale using recently devel- oped, powerful techniques such as scanning tunneling microscopy, high reso- lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure.

Compra de libros

Semiconductor Interfaces: Formation and Properties, Autores varios

Idioma
Publicado en
2011
Te avisaremos por correo electrónico en cuanto lo localicemos.

Métodos de pago

Nadie lo ha calificado todavía.Añadir reseña