Parámetros
- 689 páginas
- 25 horas de lectura
Más información sobre el libro
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
Compra de libros
Scanning Electron Microscopy and X-Ray Microanalysis, Joseph I. Goldstein, Dale E. Newbury, David C Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael
- Idioma
- Publicado en
- 2003
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- (Tapa dura),
- Estado del libro
- Bueno
- Precio
- 10,49 €
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- Subtítulo
- Third Edition
- Idioma
- Inglés
- Autores
- Joseph I. Goldstein, Dale E. Newbury, David C Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael
- Editorial
- Springer
- Publicado en
- 2003
- Formato
- Tapa dura
- Páginas
- 689
- ISBN10
- 0306472929
- ISBN13
- 9780306472923
- Serie
- Etiquetas
- No ficción, Libros de texto, Tecnología & Ingeniería, Salud & Medicina, Ciencia y Matemáticas, Guías y Manuales, Otros libros de texto, Estudios de medicina
- Descripción
- This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.